The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

16 Amorphous and Microcrystalline Materials » 16 Amorphous and Microcrystalline Materials(Poster)

[21a-P8-1~27] 16 Amorphous and Microcrystalline Materials(Poster)

Mon. Mar 21, 2016 9:30 AM - 11:30 AM P8 (Gymnasium)

9:30 AM - 11:30 AM

[21a-P8-12] Mössbauer Spectroscopic Microscope for mc-Si solar cell evaluation

Yuji Ino1, Hiroyoshi Soejima1, Kazuo Hayakawa1, Kenichi Yukihira1, Kazuhiro Fujita1, Tomio Watanabe1, Kouichi Moriguchi2, Keiko Ogai2, Yoshihito Harada2, Yutaka Yoshida1 (1.Shizuoka Inst. Sci. & Tech., 2.APCO. Ltd.)

Keywords:multi-crystalline Si,iron contamination,Mossbauer effect

A Mössbauer Spectroscopic Microscope is developed to evaluate Fe impurities in multi-crystalline Si solar cells, which combines the Mössbauer spectroscopic microscope with a scanning electron microscope (SEM), an electron beam induced current (EBIC), an electron backscatter diffraction (EBSD), and an electron energy analyzer (HV-CSA). The new microscope provides us to investigate the space correlation between Fe impurities and the lattice defects such as grain boundaries in multi-crystalline Si solar cells.