In-situ TEM observation of planar-type Cu/WO<sub>x</sub> ReRAMs

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

Mon. Mar 21, 2016 1:00 PM - 6:45 PM H111 (H)

1:00 PM - 1:15 PM

〇Satoshi Muto¹, Ryota Yonesaka¹, Atsushi Fukuchi¹, Masashi Arita¹, Yasuo Takahashi¹ (1.Hokkaido Univ.)

Keywords:ReRAM,TEM