The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[21p-H116-1~22] 3.8 Optical measurement, instrumentation, and sensor

Mon. Mar 21, 2016 1:15 PM - 7:00 PM H116 (H)

Lianhua Jin(Univ. of Yamanashi ), Shoken Ishii(NICT)

3:45 PM - 4:00 PM

[21p-H116-11] Dual photoelastic modulator and rotating wave plate based Mueller matrix polarimeter to measure the optical properties of scattering media

〇(DC)Pradipta Mukherjee2, David I. Serrano-Garcia1, Yukitoshi Otani2,1 (1.Utsunomiya Univ. Center for Optical Research and Education, 2.Utsunomiya Univ. Dept. Of Optical Engineering)

Keywords:Mueller Matrix Polarimetry,Photoelastic modulator,Scattering medium

Abstract: A Mueller matrix polarimeter based on two photoelastic modulator (PEM) and rotating wave plates has been applied to measure the optical properties of scattering media used as Intralipid. By considering the effect of the orientation errors of the elements used in proposed set-up, a more general calibration method was developed. In addition the calibration procedure for retardance error of wave plate and amplitude of modulation of PEM was considered previously. The scattering coefficients of the particles of Intralipid were obtained by using transmitted light intensity and investigated to match with the Mie scattering theory.