The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[21p-P15-1~23] 3.8 Optical measurement, instrumentation, and sensor

Mon. Mar 21, 2016 4:00 PM - 6:00 PM P15 (Gymnasium)

4:00 PM - 6:00 PM

[21p-P15-8] Fundamental study of dual-optical-comb spectroscopic ellipsometry

Takeo Minamikawa1,2, Yi-Da Hsieh1,2, Kyuki Shibuya1,2, Yoshiki Kaneohe1, Sho Okubo2,3, Hajime Inaba2,3, Yasuhiro Mizutani2,4, Takeshi Yaqui1,2, Tetsuo Iwata1,2 (1.Tokushima Univ., 2.JST-ERATO, 3.AIST, 4.Osaka Univ.)

Keywords:Dual-optical-comb spectroscopy,Spectroscopic ellipsometry

Dual-optical-comb spectroscopy is a novel spectroscopic technique with the advantages of high spectral accuracy and resolution, and short measurement time. In this study, we propose a combination of the dual-optical-comb spectrometry and an ellipsometry, which we call “dual-optical-comb spectroscopic ellipsometry”. We realized ellipsometric evaluation of several materials with ultra-high spectral accuracy and resolution, and demonstrated efficacy and usefulness of the proposed system.