The 63rd JSAP Spring Meeting, 2016

Presentation information

Poster presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

[22a-P6-1~19] 15.4 III-V-group nitride crystals

Tue. Mar 22, 2016 9:30 AM - 11:30 AM P6 (Gymnasium)

9:30 AM - 11:30 AM

[22a-P6-5] Characterization of pin-GaN diodes radiation detection for α-ray

Takuya Arikawa1, Mutsuhito Sugiura1, Shigeyoshi Usami2, Maki Kushimoto2, Yoshio Honda2, Hiroshi Amano2,3, Hidenori Mimura4, Yoku Inoue1, Toru Aoki4, Takayuki Nakano1 (1.Shizuoka Univ., 2.Nagoya Univ., 3.Akasaki Research Center, 4.R.I.E. Shizuoka Univ.)

Keywords:radiation,characterization,semiconductor