The 63rd JSAP Spring Meeting, 2016

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Oral presentation

Joint Session K » Joint Session K

[22a-S222-1~8] 21.1 Joint Session K

Tue. Mar 22, 2016 9:30 AM - 11:30 AM S222 (S2)

Yasuaki Ishikawa(NAIST)

9:30 AM - 9:45 AM

[22a-S222-1] NBITS instability evaluation of amorphous oxide semiconductor IGZO thin film

〇Satoru Tanaka1, Shimizu Kousaku1 (1.NIhon Univ.)

Keywords:Constant Photocurrent Method,InSnZnO4