Naoya Tanahashi

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Speaker, Author, Co-Author

Fri. Sep 8, 2017 1:30 PM - 3:30 PM PA1 (P)

Poster presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[8p-PA1-1~27] 6.3 Oxide electronics

1:30 PM - 3:30 PM

[8p-PA1-11] Activation Barrier Measurement of the Forming Process for an Ag/Ta₂O₅/Pt Device

〇(M1)Naoya Tanahashi¹, Tohru Tsuruoka², Tsuyoshi Hasegawa¹ (1.Waseda Univ., 2.NIMS)