Halubai Sekhar

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Speaker, Author, Co-Author

Tue. Sep 5, 2017 9:00 AM - 12:00 PM A204 (204)

Oral presentation
| 16 Amorphous and Microcrystalline Materials
| 16.3 Bulk, thin-film and other silicon-based solar cells

[5a-A204-1~11] 16.3 Bulk, thin-film and other silicon-based solar cells

10:30 AM - 10:45 AM

▲ [5a-A204-7] Measuring subsurface damage in diamond wire sawn mono-crystalline Silicon (120 µm) wafers using Raman spectroscopy

〇(P)Halubai Sekhar¹, Tetsuo Fukuda¹, Katsuto Tanahashi¹, Katsuhiko Shirasawa¹, Hidetaka Takato¹ (1.Fukushima Renewable Energy Institute, AIST)