Akinori Takeyama

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Speaker, Author, Co-Author

Tue. Sep 5, 2017 4:00 PM - 6:00 PM PB8 (P)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[5p-PB8-1~12] 15.6 Group IV Compound Semiconductors (SiC)

4:00 PM - 6:00 PM

[5p-PB8-7] Influence of negative gate bias on radiation response of SiC MOSFET

〇Akinori Takeyama¹, Takahiro Makino¹, Shuichi Okubo³, Yuki Tanaka³, Mikio Kandori³, Toru Yoshie³, Yasuto Hijikata², Takeshi Ohshima¹ (1.QST, 2.Saitama Univ., 3.Sanken Electric Co., Ltd.)

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