4:45 PM - 5:00 PM [5p-S41-13] Investigation of Suitable Approximation Order of 2-variable Function of Exposure Conditions for Half-pitch 50 nm Line-and-space Pattern Formed by Electron-beam Lithography 〇Masahito Kurouchi1, Manabu Yasui1, Satoru Kaneko1 (1.KISTEC)