Daiki Saito

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Speaker, Author, Co-Author

Wed. Sep 6, 2017 9:00 AM - 12:15 PM A201 (201)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[6a-A201-1~12] 15.6 Group IV Compound Semiconductors (SiC)

10:45 AM - 11:00 AM

[6a-A201-7] An electrical current test of SiC Schottky barrier diode with Mo₂C electrode.

〇Daiki Saito¹, Hiroshi Iwai², Kazuo Tsutsui², Kuniyuki Kakushima¹, Hitoshi Wakabayashi¹, Takuya Hoshii¹, Iriya Muneta¹ (1.Tokyo Tech Univ., 2.Tokyo Tech IIR.)