Akihiro Goryu

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Speaker, Author, Co-Author

Wed. Sep 6, 2017 1:30 PM - 7:00 PM A201 (201)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[6p-A201-1~20] 15.6 Group IV Compound Semiconductors (SiC)

2:30 PM - 2:45 PM

[6p-A201-5] The evaluation of the stress effect for stacking fault in 4H-SiC

〇Akihiro Goryu¹, Akira Kano¹, Mitsuaki Kato¹, Kenji Hirohata¹, Aoi Okada¹, Chiharu Ota¹, Joji Nishio¹, Masaki Miyazato^3,4, Tomohisa Kato⁴, Yoshiyuki Yonezawa⁴, Satoshi Izumi², Hajime Okumura⁴ (1.Toshiba, 2.Univ. of Tokyo, 3.Fuji Electric, 4.AIST)

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