11:15 AM - 11:30 AM
[7a-A204-8] Effect of bias application to pn junction during PID test for p-type crystalline silicon
〇Sachiko Jonai1, Tadanori Tanahashi1, Hajime Shibata1, Atsushi Masuda1 (1.AIST)
Thu. Sep 7, 2017 9:00 AM - 11:45 AM A204 (204)
11:15 AM - 11:30 AM
〇Sachiko Jonai1, Tadanori Tanahashi1, Hajime Shibata1, Atsushi Masuda1 (1.AIST)