Akito Oka

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Speaker, Author, Co-Author

Thu. Sep 7, 2017 1:15 PM - 6:00 PM A411 (411)

Oral presentation
| 1 Interdisciplinary Physics and Related Areas of Science and Technology
| 1.5 Instrumentation, measurement and Metrology

[7p-A411-1~17] 1.5 Instrumentation, measurement and Metrology

1:45 PM - 2:00 PM

△ [7p-A411-3] Influence of trap charges on surface temperature measurement of Si by KFM

〇(M1)Akito Oka¹, Yuuhei Suzuki¹, Kawai Taketo¹, Mani Navaneethan¹, Tatsuoka Hirokazu¹, Faiz Salleh², Ikeda Hiroya¹ (1.Shizuoka Univ., 2.Malaya Univ.)