Yuji Yamagishi

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Speaker, Author, Co-Author

Thu. Sep 7, 2017 1:30 PM - 3:30 PM PB2 (P)

Poster presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[7p-PB2-1~9] 6.6 Probe Microscopy

1:30 PM - 3:30 PM

[7p-PB2-9] Development of time-resolved scanning nonlinear dielectric microscopy and its application to the evaluation of localized defects

〇Yuji Yamagishi¹, Yasuo Cho¹ (1.Tohoku Univ.)

Tue. Sep 5, 2017 4:00 PM - 6:00 PM PB8 (P)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[5p-PB8-1~12] 15.6 Group IV Compound Semiconductors (SiC)

4:00 PM - 6:00 PM

[5p-PB8-5] An accurate evaluation of defect distributions at SiO₂/4H-SiC interfaces by the improvement of local deep level transient spectroscopy

〇Yuji Yamagishi¹, Yasuo Cho¹ (1.Tohoku Univ.)