Yumiko Takahashi

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Speaker, Author, Co-Author

Thu. Sep 7, 2017 1:30 PM - 3:30 PM PB6 (P)

Poster presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[7p-PB6-1~10] 15.7 Crystal evaluation, impurities and crystal defects

1:30 PM - 3:30 PM

[7p-PB6-9] Observation of strain field in Al ion-implanted silicon carbide crystals by angle-resolved X-ray topography considering X-ray penetration-depth dependence

〇Yumiko Takahashi¹, Keiichi Hirano¹, Takayoshi Shimura², Shinji Nagamachi³ (1.KEK-PF, 2.Osaka Univ., 3.Nagamachi Science Laboratory Co., Ltd.)