Rikiichi Ohno

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Speaker, Author, Co-Author

Fri. Sep 8, 2017 1:15 PM - 4:00 PM A411 (411)

Oral presentation
| 13 Semiconductors
| 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[8p-A411-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

1:15 PM - 1:30 PM

[8p-A411-1] Influence of VPT-Induced Trace Particles on Sensitivity in TXRF Measurements

〇Rikiichi Ohno¹, Koichiro Saga¹ (1.Sony Semiconductor Solutions)