Shouhei Fukuyama

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Speaker, Author, Co-Author

Fri. Sep 8, 2017 1:45 PM - 4:00 PM C18 (C18)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[8p-C18-1~8] 13.5 Semiconductor devices and related technologies

6.1と13.3と13.5のコードシェアセッションあり

3:30 PM - 3:45 PM

[8p-C18-7] Error Recovery Effect and High Reliable Method for Endurance in TaO_x ReRAM

〇(M1C)Shouhei Fukuyama¹, Maeda Kazuki¹, Takeuchi Ken¹ (1.Chuo Univ.)