The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[5a-A414-1~9] 3.8 Optical measurement, instrumentation, and sensor

Tue. Sep 5, 2017 9:15 AM - 11:45 AM A414 (414)

Yasukuni Shibata(Tokyo Metropolitan Univ.), Sho Ookubo(AIST)

11:15 AM - 11:30 AM

[5a-A414-8] Interference order discrimination method in single-shot two-dimensional tomography using optical frequency comb interference generated by VIPA

Futoshi Kokubun1, Tatsutoshi Shioda1 (1.Saitama Univ.)

Keywords:VIPA, Interference order, single-shot

High-speed dimensional noncontact shape measurement technology is very important in industry and medical field. Particularly, the shape measurement method based on low coherence interference is known as imaging with high resolution in the depth direction. We also developed a measurement method using VIPA as a frequency domain tomographic measurement method. However, in these methods, it is necessary to discriminate interference order in order to perform tomographic measurement. Therefore, in this study, the order of interference was judged by using the fact that the range projected on the CCD is different for each order of VIPA.