The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[5a-A414-1~9] 3.8 Optical measurement, instrumentation, and sensor

Tue. Sep 5, 2017 9:15 AM - 11:45 AM A414 (414)

Yasukuni Shibata(Tokyo Metropolitan Univ.), Sho Ookubo(AIST)

11:30 AM - 11:45 AM

[5a-A414-9] Investigation of Kramers-Kronig analysis using optical interferometer to measure sample refractive index

Syohei Gunji1, Tatsutoshi Shioda1 (1.Saitama Univ)

Keywords:Interferometer

As research on tomographic measurement technology using optical coherence tomography is progressing, we focus on the fact that the interference signal obtained from the interferometer is generated by reflected light at each interface of the sample, and by Fourier transforming the interference signal, By separately acquiring electric field spectra and applying KK analysis, we devised a method to simultaneously obtain the fault structure and the refractive index inside the specimen. In this paper, for the purpose of demonstration of the principle, we conducted an experiment to find the refractive index spectrum for each medium of the layer structure.