The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[5a-C17-1~10] 13.8 Compound and power electron devices and process technology

Tue. Sep 5, 2017 9:30 AM - 12:15 PM C17 (Training Room 2)

Takayoshi Oshima(Saga Univ.)

12:00 PM - 12:15 PM

[5a-C17-10] Evaluation of Switching and Thermal Characteristics of α-Ga2O3 Schottky Barrier Diode

Katsuaki Kawara1, Masaya Oda1, Rie Tokuda1, Hitoshi Kambara1, Takafumi Okuda2, Toshimi Hitora1 (1.FLOSFIA Inc., 2.Graduate School of Engineering, Kyoto Univ.)

Keywords:gallium oxide, power device, Schottky barrier diode

Schottky barrier diodes (SBDs) were fabricated as TO220 packaged products by using α-gallium oxide (α-Ga2O3), which is attracting attention as a semiconductor material, and the switching characteristics and thermal characteristics of the α-Ga2O3 SBD were measured for the first time. The reverse recovery time of the α-Ga2O3 SBD was shorter than that of SiC SBD and Si PN diode. Also, the thermal resistance was 13.9oC/W, which was comparable to that of SiC SBD (12.5 oC/W). This study shows that switching characteristics and thermal characteristics of the α-Ga2O3 were comparable to those of commercial products, indicating the future potential of α-Ga2O3 as a semiconductor material for power devices.