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[5a-S44-1] Conductive path along the soft X-ray beams injected into insulating materials
Keywords:Synchrotron radiation, Soft X-ray, X-ray absorption
We have recently found that TEY (total electron yield) of insulating organic films put on conductive substrates can be easily measured through the conductive substrates during soft X-ray irradiations. In the present study, we have measured the TEY intensity as the function of thickness of insulating organic films. Hence, it can be found that the TEY intensity decreases depending on the thickness according to the Lambert-Beer Law. It is therefore confirmed that conductive path can be formed along the X-ray beam path in insulating matrices.