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[5p-PA1-41] Suppression of Cu Oxidation by Single-Layer Graphene
under High Temperature and High Humidity Test
Keywords:Graphene, Cu Film, XPS
The moisture barrier properties of single-layer graphene (SLG), which was directly grown on epitaxial Cu by CVD, was investigated to study the potential of CVD-SLG barrier for Cu metallization in long-term storage memories by high temperature and high humidity (HTHH) test at 85%rh, 85oC. Optical microscopy is used to observe the color change of a Cu film. X-ray photoelectron spectroscopy (XPS) is performed to investigate the Cu oxidation. SLG film exposes the high efficient film to against the Cu oxidation from moisture.