[5p-PA3-1~46] 12.5 Organic solar cells

[5p-PA3-3] Accumulated Charge Measurement at the Metal/Fullerene Interface under Light Irradiation.

〇Masato Otsuka¹, Toshiaki Tanimura¹, Akinari Ogino¹, Tomofumi Kadoya¹, Seiichi Sato¹, Tokuji Yokomatsu², Kazusuke Maenaka², Jun-ichi Yamada¹, Hiroyuki Tajima¹ (1.University of Hyogo Mater. sci, 2.Unversity of Hyogo Eng)

Keywords:charge injection barrier, organic semiconductor, fullerene

Recently, we published a charge injection barrier measurement method by accumulated charge method (ACM).In this method, charge injection into the device having schottky junction is performed by utilizing the tunnel effect.However, in the case of samples with large junction barriers, charge injection using the tunneling effect becomes difficult and the estimation of the charge injection barrier has not succeeded.Therefore, in this study, we attempted to measure accumulated charge by optical carrier injection instead of tunnel carrier injection.In this presentation we report the results of investigating fullerenes.