[5p-PB3-1~26] 16.3 Bulk, thin-film and other silicon-based solar cells

[5p-PB3-8] Cross-sectional workfunction measurements of the interface between p-cSi and ITO under light controlled conditions

〇(PC)Fumihiko Yamada¹, Takefumi Kamioka¹, Yoshio Ohshita¹, Itaru Kamiya¹ (1.Toyota Tech. Inst.)

Keywords:KFM, interface, ITO

The efficiency of solar cell strongly depends on the electric contact of the interface between surface layers. Therefore, we measure the workfunction of the interface between surface layers using Kelvin prove microscope. In this paper, we analyzed the workfunction of the interface between p-cSi and ITO under light controlled conditions.