The 78th JSAP Autumn Meeting, 2017

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[6a-C24-1~9] 6.6 Probe Microscopy

Wed. Sep 6, 2017 9:30 AM - 11:45 AM C24 (C24)

Takeshi Fukuma(Kanazawa Univ.)

9:45 AM - 10:00 AM

△ [6a-C24-2] Nano-scale imaging and surface charge measurement of Z-DNA by using FM-AFM

〇Hiroaki Kominami1, Kei Kobayashi1, Hirofumi Yamada1 (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

Keywords:AFM, DNA