Oral presentation

[6a-C24-1~9] 6.6 Probe Microscopy

Wed. Sep 6, 2017 9:30 AM - 11:45 AM C24 (C24)

Takeshi Fukuma(Kanazawa Univ.)

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9:30 AM - 9:45 AM

△ [6a-C24-1] in situ observation of Cs adsorption at the surfaces of phyllosilicate minerals

〇(PC)Yuki Araki¹, Hiroshi Onishi², Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ., 2.Kobe Univ.)

9:45 AM - 10:00 AM

△ [6a-C24-2] Nano-scale imaging and surface charge measurement of Z-DNA by using FM-AFM

〇Hiroaki Kominami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

10:00 AM - 10:15 AM

△ [6a-C24-3] A study on fabrication methods of spherical tip for Casimir Force measurement.

〇Kazuhiko Higashino¹, Naoki Yoshida^1,2, Satoshi Hiura¹, Agus Subagyo¹, Eiji Hatta¹, Kazuhisa Sueoka¹ (1.GSIST, Hokkaido Univ., 2.JSPS Research Fellow)

10:15 AM - 10:30 AM

△ [6a-C24-4] Study on the contact potential difference on measurement of the Casimir force

〇Naoki Yoshida^1,2, Kazuhiko Higashino¹, Satoshi Hiura¹, Agus Subagyo¹, Eiji Hatta¹, Kazuhisa Sueoka¹ (1.GSIST, Hokkaido Univ., 2.JSPS Research Fellow DC)

10:30 AM - 10:45 AM

△ [6a-C24-5] Imaging contrast of anatase-TiO₂(001) by non-contact atomic force microscopy

〇daiki katsube¹, Yuji Miyato¹, Hayato Yamashita^1,2, Satoshi Abo¹, Masayuki Abe¹ (1.Osaka Univ., 2.JST PRESTO)

10:45 AM - 11:00 AM

△ [6a-C24-6] Fabrication and characterization of epitaxial Cr films tip

〇Shin Takada¹, Keito Omi¹, Satoshi Hiura¹, Agus Subagyo^1,2, Eiji Hatta¹, Kazuhisa Sueoka¹ (1.GSIST Hokkaido Univ., 2.CRIS, Hokkaido Univ.)

11:00 AM - 11:15 AM

△ [6a-C24-7] Topographical imaging and charged mapping of charged surfaces using scanning ion conductance microscopy with a theta type pipette

〇Tatsuru Shirasawa¹, Yusuke Mizutani², Tatsuo Ushiki², Futoshi Iwata^1,3 (1.Shizuoka Univ., 2.Niigata Univ., 3.Research Institute of Electronics)

11:15 AM - 11:30 AM

△ [6a-C24-8] Drift correction in scanning probe microscopy

〇Ryosuke Kizu¹, Ichiko Misumi¹, Akiko Hirai¹, Satoshi Gonda¹ (1.AIST)

11:30 AM - 11:45 AM

△ [6a-C24-9] Nanoscale investigation of the power semiconductor device by the AFM/KFM/SCFM

〇Mizuki Nakajima¹, Uchida Yuuki¹, Satoh Nobuo¹, Yamamoto Hidekazu¹ (1.Chiba Inst. of Tech.)

Oral presentation

[6p-C24-1~13] 6.6 Probe Microscopy

Wed. Sep 6, 2017 1:45 PM - 5:15 PM C24 (C24)

Takashi Ichii(Kyoto Univ.), Hayato Yamashita(Osaka Univ.)

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1:45 PM - 2:00 PM

[6p-C24-1] Visualization of polystyrene nanoparticles buried in polymer matrix by scanning thermal noise microscopy

〇Shunta Nosaka¹, Kuniko Kimura¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

2:00 PM - 2:15 PM

[6p-C24-2] Thermal vibration measurement of a micro cantilever using Fabry-Pérot Interferometer

〇Yusuke Tsujiie¹, Fumiya Hino², Shinya Marubayashi², Yoshiyuki Kawamura^1,2 (1.Grad. Sch. of FIT, 2.Fukuoka Inst. of Tech.)

2:15 PM - 2:30 PM

[6p-C24-3] Visualization of Electrochemical Activities on Nickel Hydride Electrodes

〇Akichika Kumatani¹, Motoki Tanaka¹, Makio Kon², Hiroshi Suyama², Hiroshi Nishiyama², Shinji Nakanishi², Hitoshi Shiku¹, Yasufumi Takahashi^3,4, Hideki Iba², Tomokazu Matsue¹ (1.Tohoku Univ., 2.Toyota Motor Corp., 3.Kanazawa Univ., 4.JST-PRESTO)

2:30 PM - 2:45 PM

[6p-C24-4] Development of an AFM system in liquid with a thin membrane shield

〇Keisuke Miyazawa¹, Toshiki Yamamura¹, Hisanori Izumi¹, Yasufumi Takahashi^1,2, Takeshi Fukuma^1,3 (1.Kanazawa Univ., 2.JST PRESTO, 3.JST ACT-C)

2:45 PM - 3:00 PM

[6p-C24-5] Establishment of Reusing Process of Small Cantilevers with Electron Beam Deposited Carbon Tip

〇Naoki Nakajima¹, Miyazawa Keisuke¹, Iwasaki Satoshi¹, Fukuma Takeshi^1,2 (1.Kanazawa University, 2.ACT-C)

3:00 PM - 3:15 PM

[6p-C24-6] Development of Temperature-Control Device for High Speed Atomic Force Microscopy

〇Kyosuke Kato¹, Hayato Yamashita^1,2, Satoshi Abo¹, Yuji Miyato¹, Masayuki Abe¹ (1.Osaka Univ., 2.JST PRESTO)

3:30 PM - 3:45 PM

[6p-C24-7] Humidity Dependence of Elasticty Distribution of Human Keratinocyte Investigated by Humidity-controlled Atomic Force Microscopy

〇Fumiya Komatsu¹, Mariko Toyoda¹, Kazuki Miyata¹, Takeshi Fukuma^1,2 (1.Kanazawa Univ., 2.ACT-C/JST)

3:45 PM - 4:00 PM

[6p-C24-8] Investigation of specific interactions between streptavidin and biotin using FM-AFM

〇Kazuna Sugimoto¹, Hiroaki Kominami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

4:00 PM - 4:15 PM

[6p-C24-9] Molecular-scale investigation of host-guest interaction forces by 3D-SFM in liquid

〇Sayaka Matsui¹, Shunpei Takano¹, Akio Ohta¹, Tsuyoshi Asakawa¹, Hitoshi Asakawa^1,2 (1.Kanazawa Univ., 2.JST PRESTO)

4:15 PM - 4:30 PM

[6p-C24-10] Hydration Structures of Phase Separated Self-Assembled Monolayers of Alkanethiols with Different Functional Groups Investigated by FM-AFM

〇Akito Fujita¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng.)

4:30 PM - 4:45 PM

[6p-C24-11] Relationship between surface structural dimensions and hydration structures by 3D-FM-AFM and MD calculation

〇(PC)Kenichi Umeda^1,2, Taketoshi Minato³, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ., 2.Dept. of Adv. Mater. Sci., Univ. of Tokyo, 3.SACI, Kyoto Univ.)

4:45 PM - 5:00 PM

[6p-C24-12] Interface between a nm-thick water film and a mica surface characterized by FM-AFM

〇Toyoko Arai¹, Iida Asuka¹, Sato Kohei¹, Tomitori Masahiko² (1.Kanazawa Univ., 2.JAIST)

5:00 PM - 5:15 PM

[6p-C24-13] High-speed 3D-SFM imaging of hydration structure formed at calcite/water interfaces

〇Kazuki Miyata¹, John Tracey², Adam Foster^1,2, Takeshi Fukuma^1,2,3 (1.Kanazawa Univ., 2.Aalto Univ., 3.ACT-C)

Oral presentation

[7a-C24-1~10] 6.6 Probe Microscopy

Thu. Sep 7, 2017 9:30 AM - 12:00 PM C24 (C24)

Kazuki Miyata(Kanazawa Univ.)

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9:30 AM - 9:45 AM

[7a-C24-1] The local electronic properties of individual Pt atoms on TiO₂(110) studied by Kelvin probe force microscopy

〇Yoshiaki Sugimoto¹, Ayhan Yurtsever², Delia Fernandez³, Jo Onoda¹, Masayuki Abe², Seizo Morita², Ruben Perez³ (1.Univ. Tokyo, 2.Osaka Univ., 3.Univ. Madrid)

9:45 AM - 10:00 AM

[7a-C24-2] Investigation of O-rich rutile TiO₂(110) with Kelvin probe force microscopy

〇(M1)Yuuki Adachi¹, Huanfei Wen¹, Quanzhen Zhang¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

10:00 AM - 10:15 AM

[7a-C24-3] Comparison of image aquisition methods for high-speed observation of KPFM under UHV

〇(M1)Taisuke Ochi¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

10:15 AM - 10:30 AM

[7a-C24-4] Investigation of surface potentials in reduced graphene oxide flake by KFPM

〇Ryouta Negishi¹, Kai Takashima¹, Yoshihiro Kobayashi¹ (1.Osaka Univ.)

10:30 AM - 10:45 AM

[7a-C24-5] The determination of electronegativity of individual atoms
using chemically defined AFM tips

〇Hiroki Miyazaki¹, Jo Onoda¹, Yoshiaki Sugimoto¹ (1.The Univ. of Tokyo)

10:45 AM - 11:00 AM

[7a-C24-6] Displacement of Si adatoms on Si(111)-(7×7) unveiled by dissipation channel of non-contact atomic force microscopy

〇Toyoko Arai¹, Inamura Ryo¹, Kura Daiki¹, Tomitori Masahiko² (1.Kanazawa Univ., 2.JAIST)

11:00 AM - 11:15 AM

[7a-C24-7] The conductivity at the phase boundary of the Si(111)-7x7 surface

〇Masayuki Hamada¹, Hung-Hsiang Yang¹, Yukio Hasegawa¹ (1.ISSP, the Univ. of Tokyo)

11:15 AM - 11:30 AM

[7a-C24-8] 3D Dynamic Probe Analysis of 1,4-Benzenediamine Single-Molecule Junction

〇Yoshihiro Sugita¹, Yoshida Shoji¹, Taninaka Atsushi¹, Takeuchi Osamu¹, Shigekawa Hidemi¹ (1.tsukuba univ.)

11:30 AM - 11:45 AM

[7a-C24-9] Evaluation of Atomic Arrangement of InSe Surface

〇SEIYA IWAGUMA¹, RIKU YAMAMOTO¹, SATOSHI ENDO¹, ISAMU SHINGU¹, HIROSHI TABATA¹, OSAMU KUBO¹, MITSUHIRO KATAYAMA¹ (1.Osaka Univ.)

11:45 AM - 12:00 PM

[7a-C24-10] Electronic state modification by controlled extraction of Sulfur atoms on a MoS₂ Surface

〇(M2)Takahiro Tashiro¹, Joachim Christian², Hasegawa Tsuyoshi¹ (1.Waseda Univ., 2.CNRS)

Poster presentation

[7p-PB2-1~9] 6.6 Probe Microscopy

Thu. Sep 7, 2017 1:30 PM - 3:30 PM PB2 (P)

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1:30 PM - 3:30 PM

[7p-PB2-1] Tip dependence of three-dimensional force images measured at calcite-water interfaces

〇Keisuke Miyazawa¹, John Tracey², Bernhard Reischl³, Peter Spijker², Adam Foster^1,2, Takeshi Fukuma^1,4 (1.Kanazawa Univ., 2.Aalto Univ., 3.Curtin Univ., 4.ACT-C)

1:30 PM - 3:30 PM

[7p-PB2-2] EC–FM–AFM analysis of LTO/ionic liquid interface

〇Yuya Takara¹, Mitsunori Kitta², Takashi Ichii¹, Toru Utsunomiya¹, Hiroyuki Sugimura¹ (1.Kyoto Univ., 2.AIST)

1:30 PM - 3:30 PM

[7p-PB2-3] Development of multi-environment atomic force microscope for observation of ice surface structure

〇Yuji Miyato¹, Katsuki Omani¹, Motoyasu Maeda¹, Daiki Katsube¹, Masayuki Abe¹ (1.Osaka Univ.)

1:30 PM - 3:30 PM

[7p-PB2-4] FM-AFM measurement using the quartz force sensor in humid air conditions

〇(P)Hiroaki Ooe¹, Toyoko Arai¹ (1.Kanazawa Univ.)

1:30 PM - 3:30 PM

[7p-PB2-5] Transient Carrier Dynamics of WSe₂ monolayer probed by Multi-probe Optical Pump-probe STM

〇Hiroyuki Mogi¹, Zi-hang Wang¹, Yuhei Takaguchi², Takafumi Bamba¹, Shoji Yoshida¹, Yasumitsu Miyata², Osamu Takeuchi¹, Hidemi Shigekawa¹ (1.Univ. of Tsukuba, 2.Tokyo Metro. Univ.)

1:30 PM - 3:30 PM

[7p-PB2-6] Hydrogen absorption on Pd(110), (210) studied with STM and HAS

〇Masato Tominaga¹, Takuro Maeda¹, Rikuto Shoji¹, Ryose Miyagi¹, Yoichi Yamada¹, Masahiro Sasaki¹ (1.Univ. of Tsukuba)

1:30 PM - 3:30 PM

[7p-PB2-7] Gd@C₈₂ molecule investigated by frequency modulation atomic force microscopy/Kelvin-probe force microscopy at a room temperature

〇Teruyuki Tanaka¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

1:30 PM - 3:30 PM

[7p-PB2-8] Deformation of a C₆₀ Molecule and its Change in Electronic States by precipitation of Ag Atoms from an Ag₂S Tip

〇(M1)Yuya Ishikawa¹, Tsuyoshi Hasegawa¹, Christian Joachim² (1.Waseda Univ., 2.CNRS)

1:30 PM - 3:30 PM

[7p-PB2-9] Development of time-resolved scanning nonlinear dielectric microscopy and its application to the evaluation of localized defects

〇Yuji Yamagishi¹, Yasuo Cho¹ (1.Tohoku Univ.)

Sessions

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[6a-C24-1~9] 6.6 Probe Microscopy

△ [6a-C24-1] in situ observation of Cs adsorption at the surfaces of phyllosilicate minerals

△ [6a-C24-2] Nano-scale imaging and surface charge measurement of Z-DNA by using FM-AFM

△ [6a-C24-3] A study on fabrication methods of spherical tip for Casimir Force measurement.

△ [6a-C24-4] Study on the contact potential difference on measurement of the Casimir force

△ [6a-C24-5] Imaging contrast of anatase-TiO2(001) by non-contact atomic force microscopy

△ [6a-C24-6] Fabrication and characterization of epitaxial Cr films tip

△ [6a-C24-7] Topographical imaging and charged mapping of charged surfaces using scanning ion conductance microscopy with a theta type pipette

△ [6a-C24-8] Drift correction in scanning probe microscopy

△ [6a-C24-9] Nanoscale investigation of the power semiconductor device by the AFM/KFM/SCFM

[6p-C24-1~13] 6.6 Probe Microscopy

[7a-C24-1~10] 6.6 Probe Microscopy

[7p-PB2-1~9] 6.6 Probe Microscopy

Authentication

△ [6a-C24-5] Imaging contrast of anatase-TiO₂(001) by non-contact atomic force microscopy