[7p-PB2-1~9] 6.6 Probe Microscopy

[7p-PB2-3] Development of multi-environment atomic force microscope for observation of ice surface structure

〇Yuji Miyato¹, Katsuki Omani¹, Motoyasu Maeda¹, Daiki Katsube¹, Masayuki Abe¹ (1.Osaka Univ.)

Keywords:atomic force microscopy, quartz resonator

A frequency-modulation atomic force microscope (FM-AFM) with a multi-environmental control has been developed to reveal the crystal growth processes of ice at the liquid-solid/gas-solid interface. The concept of the AFM system is to control the sample’s surrounding air-temperature, the humidity, the pressure, and the sample substrate temperature. The tuning-fork quartz sensor is also employed in the AFM system because of a little influence of the surface-absorbed water. The progress of the system-development will be explained.