[6p-A203-1~19] 12.4 Organic light-emitting devices and organic transistors

[6p-A203-18] Influence of material impurities in hole-blocking layer on OLED degradation

〇Hiroshi Fujimoto^1,2, Ko Inada², Satoshi Yukiwaki¹, Keiko Kusuhara², Nozomi Nakamura², Masayuki Yahiro^1,2,3, Chihaya Adachi^1,2,3 (1.i3-OPERA, 2.Opera Kyushu Univ., 3.ISIT)

Keywords:OLED, Lifetime, impurities

We discovered a correlation between device stability and the purity of hole blocking layer (HBL). Although there is no change in the J-V-L characteristics, there exists a nine fold improvement in device stability in the device fabricated by highly purify HBL materials. We considered the cause of degradation using DFT calculation. Our results suggest two possibilities, 1) the Cl from chloro-derivative diffused and causing degradation. 2) chloro-derivative increase the amount of radical anion which accelerated the emitting materials degradation.