[6p-C24-1~13] 6.6 Probe Microscopy

[6p-C24-12] Interface between a nm-thick water film and a mica surface characterized by FM-AFM

〇Toyoko Arai¹, Iida Asuka¹, Sato Kohei¹, Tomitori Masahiko² (1.Kanazawa Univ., 2.JAIST)

Keywords:nm-thick water film, frequency-modulation atomic force microscopy

A solid/water interface of an approximately 2-nm-thick water film on a cleaved muscovite mica surface was analyzed on the atomic scale using a frequency-modulation atomic force microscope operated in air. The water film was grown from water vapor under ambient conditions just after cleavage of the mica. At the interface, the adsorption layer, which comprised K⁺ ions and water molecules, and the first three hydration layers over the adsorption layer were imaged. The image contrast revealed two alternating periodic lattice structures of the mica surface: honeycomb and dot-array patterns.