[6p-PA8-1~31] 13.8 Compound and power electron devices and process technology

[6p-PA8-4] Analyses of Electronic and Atomic Structures of Insulator/GaN Interface by Photoelectron Diffraction and Spectroscopy

〇Yuta Fujimoto¹, Mutsunori Uenuma¹, Hiroshi Ota¹, Fumihiko Matsui¹, Yasuaki Ishikawa¹, Yukiharu Uraoka¹ (1.NAIST)

Keywords:Photoelectron Diffraction and Spectroscopy, GaN