2017年第78回応用物理学会秋季学術講演会

講演情報

一般セッション(口頭講演)

9 応用物性 » 9.2 ナノワイヤ・ナノ粒子

[6p-S44-1~21] 9.2 ナノワイヤ・ナノ粒子

2017年9月6日(水) 13:15 〜 19:00 S44 (第5会議室)

深田 直樹(物材機構)、石川 史太郎(愛媛大)、清水 智弘(関西大)

16:15 〜 16:30

[6p-S44-12] Photo-Assisted Dissolution of Porous Silicon Nanostructures in HF Solutions Monitored by Photoconduction

Bernard Gelloz1、Hiroki Fuwa2、Eiichi Kondoh2、Lianhua Jin2 (1.Nagoya Univ.、2.Yamanashi Univ.)

キーワード:porous silicon, optical absorption, nanostructure

Porous silicon (PSi) formed by electrochemical etching of lightly-doped silicon substrates in hydrofluoric acid (HF) exhibits a sponge-like nanostructure. It has potential applications in optoelectronics and photovoltaics because of new properties emerging from quantum confinement (QE), such as light emission and tunable optical absorption. After PSi formation, further chemical dissolution in HF can be used to increase the porosity. In an earlier work, we have used photoconduction to monitor the chemical dissolution of PSi in solutions containing HF [1,2]. The study also allowed the derivation of the PSi absorption coefficient for a very wide range of porosities, as well as the Si dissolution rate for various HF concentrations [2]. For high HF concentrations the chemical dissolution is very slow. In such case, dissolution can still be obtained at a rather high rate under illumination by photo-generation of holes in the PSi structure. We have studied the photo-assisted dissolution of PSi using the monitoring technique previously shown [1,2]. The effects of PSi thickness, illumination power and wavelengths were investigated. The photo-dissolution rate as a function of illumination power was found to reach a saturation state. A model of the photo-dissolution was also developed.