[7a-PA6-1~14] 6.1 Ferroelectric thin films

[7a-PA6-7] Electric-field-induced lattice distortions in epitaxial BiFeO₃ thin films

〇Seiji Nakashima¹, Hironori Fujisawa¹, Osami Sakata², Hiroshi Funakubo³, Takao Shimizu³, Daichi Ichinose³, Yasuhiko Imai⁴, Masaru Shimizu¹ (1.Univ.of Hyogo, 2.NIMS/SPring-8, 3.Tokyo Tech., 4.JASRI)

Keywords:ferroelectric thin films, BiFeO3, electric-field-induced strain

Lattice parameters of 1-µm-thick single-domain BiFeO₃ thin films have been evaluated by in-situ time-resolved X-ray diffraction under electric fields using synchrotron radiation. These results revealed that the BFO lattice elongated along the vertical direction and compressed along in-plane direction. In addition, the BFO crystals were rotated as a result of electric-field-induced lattice distortion under epitaxial strain of the vicinal substrate.