[7a-PB3-1~9] 13.5 Semiconductor devices and related technologies

△ [7a-PB3-9] Charge-pumping electrically-detected magnetic resonance for detection of silicon dangling bonds

〇Masahiro Hori¹, Toshiaki Tsuchiya¹, Yukinori Ono¹ (1.Shizuoka Univ.)

Keywords:charge pumping, electrically detected magnetic resonance, interface defect