The 78th JSAP Autumn Meeting, 2017

Presentation information

Symposium (Oral)

Symposium » Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices

[7p-C13-1~9] Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices

Thu. Sep 7, 2017 1:45 PM - 6:00 PM C13 (office 2-2)

Reo Kometani(Univ. of Tokyo), Hiroshi Mizuta(JAIST), Shinichi Ogawa(AIST)

3:15 PM - 3:45 PM

[7p-C13-5] Nanopore Fabrication to Two Dimensional Crystals by Adjusting Dose and focus of Helium Ion Microscope

Kentaro Kawai1, Takumi Hayashi1, Kenta Arima1, Osamu Tabata2 (1.Osaka University, 2.Kyoto Univesity)

Keywords:Nanopore

Single-molecule detection using nanopore have been developed in the past decade. The principle of detection among major nanopore sensors is detecting characteristic change of ionic current when a molecule passes through. DNA sequencing is one of the promising applications for nanopore sensing device. The sensitivity of DNA nanopore sequencer is rely on the diameter and thickness of the nanopore. To make precose size of nanopore on two dimensional crystals, ion milling by Helium ion microscope was applied with controlling the dose amount and focus distance.