[7p-C16-1~18] 17.2 Graphene

[7p-C16-18] Lock-in thermal imaging of local defects in large area graphene sheets

〇Hideaki Nakajima¹, Takahiro Morimoto¹, Yoshizumi Ikuta¹, Yuki Okigawa¹, Takatoshi Yamada¹, Kenji Kawahara², Hiroki Ago², Toshiya Okazaki¹ (1.AIST, 2.GIC Kyushu University)

Keywords:graphene, defect, lock-in thermal

Despite the impressive progress of CVD graphene with respect to enabling large area synthesis, many defects strongly limit the electrical characterization. Several experimental techniques have been so far developved to characterize these local defects, however they are based on nanoscopic observation and are not suitable for wide scale examination. In this conference, we present the imaging of local defects in large area CVD graphene sheets by using lock-in thermography. The various defects from micro to atomic scales are clearly visualized with a large scale. Our result is of primary importance for speedy and precise characterization of electrical transport property in a large area sheet toward development of state-of-the-art graphene devices.