3:30 PM - 3:45 PM
△ [7p-S22-8] Threshold Voltage Engineering of Recessed MIS-Gate N-polar GaN HEMTs
Keywords:N-polar GaN, Recess MIS-gate, High Electron Mobility Transistors (HEMTs)
Oral presentation
13 Semiconductors » 13.8 Compound and power electron devices and process technology
Thu. Sep 7, 2017 1:30 PM - 5:15 PM S22 (Palace B)
Kenji Shiojima(Univ. of Fukui), Kozo Makiyama(Fujitsu Lab.)
3:30 PM - 3:45 PM
Keywords:N-polar GaN, Recess MIS-gate, High Electron Mobility Transistors (HEMTs)