The 78th JSAP Autumn Meeting, 2017

Presentation information

Poster presentation

13 Semiconductors » 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

[8p-PA2-1~19] 13.4 Si wafer processing /Si based thin film /Interconnect technology/ MEMS/ Integration technology

Fri. Sep 8, 2017 1:30 PM - 3:30 PM PA2 (P)

1:30 PM - 3:30 PM

[8p-PA2-15] A Tilt Sensor Using a High-Resolution MEMS Inertial Sensor Fabricated by Multi-Layer Metal Technology

Ippei Tsuji1,3, Motohiro Takayasu1,3, Hiroyuki Ito1,3, Daisuke Yamane1,3, Shiro Dosho1,3, Toshifumi Konishi1,2,3, Noboru Ishihara1,3, Katsuyuki Machida1,3, Kazuya Masu1,3 (1.Tokyo Tech., 2.NTT-AT, 3.JST-CREST)

Keywords:Multi-Layer Metal Technology, MEMS Inertial Sensor, Tilt Sensor