Hiroki Wakimoto

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 1:45 PM - 5:30 PM F201 (F201)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[14p-F201-1~14] 15.7 Crystal evaluation, impurities and crystal defects

4:00 PM - 4:15 PM

[14p-F201-9] DLTS measurements of p/n junction implanted with boron ions to n type Si substrate

〇Hiroki Wakimoto¹, Haruo Nakazawa¹, Takashi Matsumoto², Yoichi Nabetani² (1.Fuji Electric, 2.Yamanashi Univ.)