Fumihiro Fujie

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Speaker, Author, Co-Author

Wed. Mar 15, 2017 9:00 AM - 12:15 PM F204 (F204)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[15a-F204-1~12] 15.6 Group IV Compound Semiconductors (SiC)

9:30 AM - 9:45 AM

△ [15a-F204-3] In situ observation of stacking fault expansion in 4H-SiC by X-ray topography in back reflection geometry

〇Fumihiro Fujie¹, Shunta Harada¹, Kenta Murayama¹, Kenji Hanada¹, Penglei Chen¹, Tomohisa Kato², Miho Tagawa¹, Toru Ujihara^1,2 (1.Nagoya Univ., 2.AIST)

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