Yoshifumi Sakaguchi

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 9:30 AM - 11:30 AM 213 (213)

Oral presentation
| 16 Amorphous and Microcrystalline Materials
| 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[16a-213-1~7] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

10:30 AM - 10:45 AM

[16a-213-5] X-ray diffraction measurement of amorphous Ge-S using synchrotron radiation - local structural changes by the variation of Ge composition

〇Yoshifumi Sakaguchi¹, Takayasu Hanashima¹, Ohara Koji², Maria Mitkova³ (1.CROSS, 2.JASRI, 3.BSU (U.S.A.))