Kaneda Yuichi

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 2:00 PM - 5:00 PM 413 (413)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[16p-413-1~11] 13.3 Insulator technology

6.1と13.3と13.5のコードシェアセッションあり

4:15 PM - 4:30 PM

[16p-413-9] Characterization of defect property in MOCVD-grown Ge_1-xSn_x gate stuck structures

〇Kaneda Yuichi¹, Shinichi Ike^1,2, Masayuki Kanematsu¹, Mitsuo Sakashita¹, Wakana Takeuchi¹, Osamu Nakatsuka¹, Shigeaki Zaima^1,3 (1.Grad. Sch. of Eng., Nagoya Univ, 2.JSPS Research Fellow, 3.IMaSS, Nagoya Univ)

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