Kazutaka Kanegae

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 9:30 AM - 11:45 AM 315 (315)

Oral presentation
| 13 Semiconductors
| 13.8 Compound and power electron devices and process technology

[14a-315-1~8] 13.8 Compound and power electron devices and process technology

10:15 AM - 10:30 AM

△ [14a-315-4] Characterization of hole traps in n-type GaN homoepitaxial layers by MCTS using sub-bandgap light excitation

〇Kazutaka Kanegae¹, Masahiro Horita², Tsunenobu Kimoto², Jun Suda^2,3 (1.Kyoto Univ., 2.Dept. of Electron. Sci. & Eng., Kyoto Univ., 3.Nagoya Univ. IMaSS)

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