JUN FUJISE

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 9:15 AM - 12:15 PM F201 (F201)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[14a-F201-1~11] 15.7 Crystal evaluation, impurities and crystal defects

9:45 AM - 10:00 AM

[14a-F201-3] Effect of Annealing on Generation of Slip Dislocation from Scratches in Si Wafers

〇JUN FUJISE¹, Toshiaki Ono¹ (1.SUMCO)