Xuefeng Han

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 9:15 AM - 12:15 PM F201 (F201)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[14a-F201-1~11] 15.7 Crystal evaluation, impurities and crystal defects

10:30 AM - 10:45 AM

▲ [14a-F201-6] Numerical analysis on the free surface of floating zone (FZ) for silicon crystal growth by Volume of Fluid (VOF) model

〇(P)Xuefeng Han¹, Satoshi Nakano¹, Xin Liu¹, Koichi Kakimoto¹ (1.RIAM, Kyushu Univ.)