FUMIMASA HORIKIRI

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 1:15 PM - 5:15 PM 315 (315)

Oral presentation
| 13 Semiconductors
| 13.8 Compound and power electron devices and process technology

[14p-315-1~15] 13.8 Compound and power electron devices and process technology

2:45 PM - 3:00 PM

[14p-315-7] Wafer-level nondestructive inspection regarding the substrate off-angle and the yellow luminescence of n^--drift layer in vertical GaN-on-GaN Schottky diodes

〇FUMIMASA HORIKIRI¹, YOSHINOBU NARITA¹, TAKEHIRO YOSHIDA¹, TOSHIO KITAMURA¹, HIROSHI OHTA², TOHRU NAKAMURA², TOMOYOSHI MISHIMA² (1.Sciocs Co. Ltd., 2.Hosei Univ.)