Shivaji Bachche

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Speaker, Author, Co-Author

Wed. Mar 15, 2017 9:00 AM - 12:00 PM 318 (318)

Oral presentation
| CS Code-sharing session
| CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

[15a-318-1~11] CS.4 7. Code-sharing Session: Beam Technology and Nanofabrication

11:15 AM - 11:30 AM

▲ [15a-318-9] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – IV

〇Shivaji Bachche¹, Masahiro Nonoguchi², Koichi Kato², Masashi Kageyama², Takafumi Koike², Masaru Kuribayashi², Atsushi Momose¹ (1.Tohoku Univ., 2.Rigaku Corp.)

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