10:45 〜 11:00 ▲ [15a-513-7] Cathodoluminescence Characterization of Mix and Edge Dislocations in etched GaN 〇Luo Xianjia1、Yuichi Oshima2、Kimura Takashi1、Sekiguchi Takashi1 (1.MANA, NIMS、2.RCFM, NIMS)