Hidekazu Yamamoto

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Speaker, Author, Co-Author

Wed. Mar 15, 2017 9:00 AM - 12:15 PM F201 (F201)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[15a-F201-1~12] 15.7 Crystal evaluation, impurities and crystal defects

11:45 AM - 12:00 PM

[15a-F201-11] Evaluation of SiC Schottky barrier diode by multifunctional scanning probe microscope

〇Hidekazu Yamamoto¹, Takeshi Uruma¹, Nobuo Satoh¹ (1.Chiba Inst. of Tech.)