Sou Maejima

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 9:00 AM - 12:15 PM 419 (419)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[16a-419-1~12] 6.3 Oxide electronics

9:15 AM - 9:30 AM

[16a-419-2] Evaluation of Horizontal Leakage Current Conduction between Electrodes of Oxide Device of ReRAM

〇Sou Maejima¹, Sugie Toshiyki¹, Hayashi Yuya¹, Yamashita Kaoru¹, Noda Minoru¹ (1.Kyoto Inst. Tech.)